An atomic force microscopy (AFM) is a type of scanning probe microscope (SPM). It uses a very sharp probe that is raster-scanned to produce a true 3D topographical map of the surface of a sample with nanoscale resolution.

Atomic force microscopy enables the high-resolution imaging and precise measurement of the nanoscale forces necessary for these types of investigation, making it an essential tool for: Investigating biophysics and biomechanics (cell mechanics and adhesion).

The compact Innova ® atomic force microscope (AFM) delivers application flexibility for the most demanding scientific research at a moderate cost. Its unique closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of …

Dec 2, 2024 · Dimension Nexus is the newest addition to the industry-leading Dimension® AFM product line, which has had more than 4600 systems installed around the world. With the latest-generation NanoScope® 6 controller, this new small-footprint AFM delivers wider access to Bruker’s exclusive PeakForce Tapping® technology and over 50 AFM modes.

As the worldwide leader in scanning probe microscope (SPM) and atomic force microscope (AFM) instrumentation, Bruker is consistently driving and shaping the future of the industry.

Dec 3, 2024 · At the 2024 MRS Fall Meeting & Exhibit, Bruker Corporation today announced the launch of the Dimension Nexus ™ atomic force microscope (AFM). Dimension Nexus is the newest addition to the industry‑leading Dimension ® AFM product line, which has had more than 4600 systems installed around the world.

The compact Innova ® atomic force microscope (AFM) delivers application flexibility for the most demanding scientific research at a moderate cost. Its unique closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of …

Apr 16, 2024 · Bruker’s atomic force microscopy (AFM)-based techniques set industry-leading standards, delivering highest accuracy and non-destructive, high-throughput solutions for R&D and fully automated in-line process control.

Critical Dimension Atomic Force Microscopy (CDAFM) is a proprietary AFM mode from Bruker. This nondestructive, high-resolution technique enables accurate measurement of three-dimensional (3D) features by using boot-shaped CD AFM probes.

An atomic force microscopy (AFM) is a type of scanning probe microscope (SPM). It uses a very sharp probe that is raster-scanned to produce a true 3D topographical map of the surface of a sample with nanoscale resolution.