The ZnO electron-transporting layer was prepared using a sol–gel process as described in detail elsewhere. (30) The ZnO precursor was doctor-bladed on the top of ITO substrates and annealed for 20 min ...

To address the needs of the rapidly growing battery market, Thermo Fisher Scientific introduced the Thermo Scientific™ LInspector™ Edge In-line Mass Profilometer, which delivers full-width electrode ...

Thermo Scientific™ LInspector™ Edge In-line Mass Profilometer Delivers Real-time, Full-Coverage Mass Loading Analysis for Battery Electrode Coating WALTHAM, Mass.--(BUSINESS WIRE)--To address ...

The thickness of the films, measured using a Dektak profilometer, demonstrated an increase from 1.9 to 2.8 µm as the deposition temperature rose. Nanoindentation testing revealed that the film ...

Profilometer (Stylus) - Veeco Dektak®150 Metrology Stylus profilers are used to measure surface metrology variations on flat substrates. This profilometer features an automated stage with step height, ...

Davis Hall, Suite 114 University at Buffalo North Campus Buffalo, NY 14260 ...

The graphs obtained using the equipment profilometer DEKTAK showing the roughness of Al 2 O 3 before and after wet treatment, and the behavior of Ni-P film morphology deposited by electroless process ...

The feasibility of using DNR-L300 negative photoresist to fabricate the micro-lens on InGaAs/AlGaAs MQW LED for enhancing the fiber-coupled LED performance was studied in this report. The measurement ...

Figure 4 shows the roughness measured by a profilometer DekTak XT in two points of the sample (P1 and P2). It is verified that the roughness before treatment (black and green lines) is about 25 nm on ...