WAXS diffractograms were recorded on a Bruker D8 Discover X-ray diffractometer equipped with a Bruker IμS Diamond Cu K α source and scintillation counter using a Bruker Våntec-500 2D detector.

X-ray diffraction (XRD): the phase analysis was conducted by X-ray powder diffraction (XRD) employing an XRPD, Bruker D8 using CuKα radiation, λ= 1.54060 A°, graphite monochromator, 40 kV-30 mA, 2θ= ...

2.2. Residual Stress Measurements The X-ray diffraction measurements were carried out using Cr Ka X-rays from a tube operated at 35 kV and 40 mA through a 0.5 mm diameter total reflection collimetor ...

FTIR spectroscopy was performed on a TENSOR27 FTIR spectrometer (Bruker, Karlsruhe, Germany). XPS analyses were carried out on an X-ray photoelectron spectrometer (Kratos, Manchester, UK). XRD was ...

The RIT III-V EPICenter is a III-V materials growth facility capable of providing small-batch epitaxial services. Since its beginnings in the 1970s, growth of thin films of epitaxial crystals has ...

Insights into antibiotic–carrier interactions in the silk-fibroin-based nanoparticles and considerations on the formulation process greenness are limited. Hence, this work developed and characterized ...

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