Topography images were obtained in a MultiMode8 atomic force microscope (Bruker) in peak force tapping mode. A SCANASYST-AIR probe (Bruker ... and dried under a gentle N 2 flow for 3 h. The AFM ...

Peter De Wolf is director for AFM technology & application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, ...

Figure 3. Diluted PS-b-PMMA core shell sample (with a 0.2 N/m probe) height, adhesion, and IR absorption, demonstrating spatial resolution of <10 nm with REFV AFM-IR. Image Credit: Bruker Nano ...

BioAFM is seeing increasingly widespread use in biomedical and biological studies due to its extremely high resolution and its capacity to perform experiments with live cells in liquid and under ...

Images were collected using torsional resonance dynamic force microscopy (TR-DFM) with a FESPA probe ... Bruker Nano Surfaces and Metrology Bruker offers an extensive selection of advanced AFM ...

Peter De Wolf is director for AFM technology & application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC ...

Bacteria navigate tradeoffs between phage resistance and interbacterial competition. This study reveals that while LPS ...

Image Credit: Bruker Nano Surfaces and Metrology SPM imaging provides precise test positioning and measurement of material deformation. User-defined force setpoints enable imaging of both hard and ...

Atomic Force Microscopy, Department of Materials, Imperial College London The Bruker Innova is available for routine analysis of samples and is able to probe the topography of the sur-face using ...