Scanning Electron Microscopy (SEM) is an ideal observation tool for small scales robotics. It has the potential to achieve automated nano-robotic tasks such as nano-handling and nano-assembly. Path ...

Infinitesima says that SK hynix, a full stack artificial intelligence (AI) memory provider, has adopted the Metron®3D 300mm ...

Prof. Dr. Franz J. Gießibl Chair of Experimental and Applied Physics University of Regensburg Tel: +49 (0)941943-2105 E-mail: [email protected] ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

A research team led by Prof. Tian-Bao Ma from the Department of Mechanical Engineering at Tsinghua University has proposed a ...

Korean memory chipmaker SK Hynix has adopted the Metron 3D 300 mm in-line wafer metrology system from Infinitesima. SK Hynix will use the technology in volume production as it provides 3D process ...

News Highlights Ultra-fast, in-line atomic force microscope (AFM), the Metron®3D, goes online for advanced DRAM manufacturing at SK hynix in KoreaThe Metron®3D is able to generate images at speeds 10× ...

Atomic force microscopy (AFM) is a highly useful instrument for material inspection, capable of scanning conductive and nonconductive samples without any restrictions as to the environment in which it ...