Bruker’s Dimension Icon AFM (atomic force microscope ... sets a new benchmark in high-performance surface characterization. A state-of-the-art confocal µ-Raman system together with the Dimension Icon ...

Atomic force microscopy is a subset of scanning probe microscopy ... Theory and practice of fluorescence (including confocal and multi-photon), atomic force, scanning and transmission electron, and ...

WITec’s alpha300 R confocal Raman microscope series pioneered ... Raman imaging with complementary imaging methods such as AFM, SNOM and SEM, and lets it evolve with changing experimental ...

Cantilevers are located in a box in the AFM lab. There is a log sheet next to them ... Theory and practice of fluorescence (including confocal and multi-photon), atomic force, scanning and ...

The system can be fitted with the advanced Pulsed Force Mode intermittent contact module for materials research imaging applications. Other microscopy methods that can be incorporated with the AFM ...

A variety of nanomaterials samples systems will be characterized using laser scanning confocal microscopy (LSCM), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and atomic ...

For extremely precise and reproducible image analysis, a micro-lens enhanced spinning disc confocal provides a flat field of vision. Shorter exposure times produce up to a two-fold boost in scan ...

A proprietary AFM objective allows simultaneous cantilever and sample observation The alpha300 A was designed and developed to be used with other imaging methods such as confocal Raman imaging and ...