2.2. Residual Stress Measurements The X-ray diffraction measurements were carried out using Cr Ka X-rays from a tube operated at 35 kV and 40 mA through a 0.5 mm diameter total reflection collimetor ...

KONTICH, Belgium, February 27, 2025--(BUSINESS WIRE)--Bruker Corporation (Nasdaq: BRKR) today announces the launch of the new X4 POSEIDON™, a high-performance 3D X-ray microscope (XRM ...

Bruker Corporation BRKR recently launched the new X4 POSEIDON, a high-performance 3D X-ray microscope (XRM) using micro-Computed Tomography (microCT). Representing a significant leap in benchtop ...

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WAXS diffractograms were recorded on a Bruker D8 Discover X-ray diffractometer equipped with a Bruker IμS Diamond Cu K α source and scintillation counter using a Bruker Våntec-500 2D detector.

KONTICH, Belgium - Bruker Corporation (NASDAQ:BRKR), a $7.37 billion scientific instruments manufacturer currently trading near its 52-week low of $48.36, has introduced the X4 POSEIDON, a new ...