The special option for plug-and-play cantilever exchange ensures rapid and safe operation of the system Samples can be freely accessed from the sides for unique stages and sample holders The AFM ...
The ProberStation 200â„¢ is an advanced stage meant for AFM measurement on bulk samples. The long-range XY translators of the ProberStation 200â„¢ help analyze 200-mm specimens at all places and up to 300 ...
It is also used in measurements of surface and adhesion forces. The Veeco Dimension 3000 atomic force microscope (AFM) is used to analyze a variety of sample sizes and types. It can function in air or ...
SEOUL, South Korea, Feb. 18, 2025 /PRNewswire/ -- Park Systems, a global leader in atomic force microscopy (AFM), has unveiled an expanded FX Large Sample AFM series at SEMICON Korea 2025.
C-AFM allows researchers to simultaneously map the topography and local electrical properties of a sample, providing valuable insights into the structure-property relationships of nanomaterials and ...
The completely programmable sample positioning allows independent AFM measurements on various sample positions with automatic report generation and automatic image analysis. The integration with high ...
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