Scientists uncover how hydrophobic surfaces trap nanoplastics, offering fresh insight into their movement and impact on soil ...

Photo-induced force microscopy began as a concept in the mind of Kumar Wickramasinghe when he was employed by IBM in the ...

Atomic force microscopy (AFM) is a technique for visualizing a variety of samples, from single molecules to living cells, at ultrahigh resolution.

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

A research team led by Prof. Tian-Bao Ma from the Department of Mechanical Engineering at Tsinghua University has proposed a ...

Atomic force microscopy (AFM) has become an indispensable technique for examining various samples with nanoscale resolution under physiological conditions. In addition to topographic measurements ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Atomic Force Microscopy Digital Instrument's BioScope Anyone who has ever taken the time to critically examine a walnut knows that a two-dimensional photograph fails in many respects to truly convey ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

Atomic force microscopy (AFM) was originally invented for visualizing surfaces with nanoscale resolution. Its basic working principle is to move an ultrathin tip over a sample’s surface.

Conductive atomic force microscopy (C-AFM) enables simultaneous mapping of topography and local electrical properties at the nanoscale, providing insights for nanoelectronics and materials science.