Figure 1. Simultaneous multimodal imaging (height, adhesion, and IR absorption) enabled by REFV AFM-IR. Image Credit: Bruker Nano Surfaces and Metrology REFV AFM-IR offers its users: The ability to ...
Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...
Boise State University has qualified a new Aixtron 2D Close Coupled Showerhead MOCVD system for multi-wafer growth of wide ...
Image Credit: Bruker Nano Surfaces and Metrology Nexus offers significant benefits for researchers in early-stage labs or those planning to expand their AFM research capabilities: The base ...
Bruker has been leading the expansion of atomic force microscope (AFM) capabilities since the very beginning, and our systems are the most cited AFMs in the world. Our comprehensive suite of AFMs ...
Bruker Corporation (Nasdaq: BRKR) today announces the launch of the new X4 POSEIDON™, a high-performance 3D X-ray microscope (XRM) using micro-Computed Tomography (microCT). This innovative ...
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