Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...

the FX Large Sample AFM series enhances usability with automated probe recognition and exchange, a QR code system for probe status monitoring, and AI-driven laser alignment for seamless operation.

the FX Large Sample AFM series enhances usability with automated probe recognition and exchange, a QR code system for probe status monitoring, and AI-driven laser alignment for seamless operation. The ...

Image Credit: Bruker Nano Surfaces and Metrology Nexus offers significant benefits for researchers in early-stage labs or those planning to expand their AFM research capabilities: The base ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. We propose using Bruker’s sharp, high-performance cantilevers, such as the HPI ...