On-silicon editing and probe testing can be done using one tool, speeding the use of the FIB/SEM for failure analysis, debug, and circuit editing.

NEW YORK (AP) — Electric utility Con Edison was working Friday to figure out what caused a high-voltage equipment failure that unleashed an otherworldly flash of bright blue light in the nigh… ...

Reginald C. Farrow and Zafer Iqbal, research professors at NJIT, were awarded a patent today for an improved method of fabricating arrays of nanoscale electrical probes.

"This also means insertion of nanoFETs is not nearly as traumatic to the cell as current electrical probes. We found that nanoFETs can be inserted and removed from a cell multiple times without ...