Incorporating the latest evolution of Bruker’s industry-leading tip-scanning AFM technology, the Dimension Icon AFM’s temperature-compensating position sensors render noise levels in the sub-angstroms ...

Bruker’s Dimension Icon AFM (atomic force microscope) offers excellent resolution, reliability and productivity, whilst maintaining the highest level of expandability. With the advent of integrated ...

Based upon the highly successful Dimension Icon® AFM architecture ... Atomic Force Microscope (the world's fastest AFM) will enable you to scan once and get all the details you need. Contact Bruker ...

Scan sizes 1 × 1 µm and 200 × 200 nm (orange box). Image Credit ... in-class general purpose AFM. Image Credit: Bruker Nano Surfaces and Metrology Dimension Icon - gold standard for advanced ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Bruker's Dimension Icon AFM integrates the ...