The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including ...

A new version of the Soft X-Ray Emission Spectrometer with a wider energy range has been added by JEOL (SXES-ER). The spectral range of the SXES-ER is 100 eV to ~2300 eV. Using the L, M, and N lines, ...

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The Epsilon 4, an energy dispersive X-ray fluorescence (EDXRF) benchtop spectrometer, offers non-destructive elemental analyses of impurities in active pharmaceutical ingredients and excipients in ...