Tech Xplore on MSN
Researchers develop tailored pulsed power modulator for bias in semiconductor processing
A research team led by Dr. Jang Sung-roc at the Electrophysics Research Center of the Korea Electrotechnology Research ...
A tough challenge for test engineers is explored in terms of test methods, pitfalls, and measurement errors. For the test engineer, RF and microwave power amplifier testing imposes unique challenges.
Advanced RF pulsing, direct match-generator synchronization, and impedance-matching technology are critical to achieving precision in angstrom-scale semiconductor manufacturing. Challenges like higher ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results