Stylus profilers are used to measure surface metrology variations on flat substrates. This profilometer features an automated stage with step height, surface roughness, and film stress measurement ...

Brian Crawford from KLA demonstrates their P-6 stylus profilometer that uses contact stylus technology that typically uses a 2µm stylus tip although other options are abvailable.

Most surface metrology needs can be met by one of three complementary tools - the white light interferometer, the atomic force microscope and the stylus profilometer. Quantitative measurement of ...

This video demonstrates how fast and easy it is to change a stylus on the KLA Instruments™ Alpha-Step® stylus profilometers. The easy replacement step is followed by a quick video adjustment and then ...

KLA-Tencor Corp. and SII NanoTechnology (SIINT) a subsidiary of Japanese company Seiko Instruments, have formed a partnership to distribute SIINT's Nanopics 2100 atomic force profilometer outside of ...

The absorption of the carbonylic groups of this sample was measured multiple times, averaged and compared with that of a 90 nm PMMA film (determined by stylus profilometer).

Professor Robert Wood and his team working at the Harvard School of Engineering and Applied Sciences chose the Olympus LEXT OLS4000 Laser Scanning Confocal Microscope as their optical metrology tool ...