Fraunhofer researchers have developed a very fast technology for determining whether a tumor has been fully removed—before the patient even leaves the operating theater. Using a combination of laser ...

Why non-destructive SAM is an efficient tool for analysis of adhesion between layers and presence of possible flaws in each layer. Scanning acoustic microscopy, or SAM, is a non-destructive technique ...

Most automated quality inspection technologies involve machine vision systems and, increasingly, aspects of artificial intelligence-powered software to speed the identification of part defects. But ...

View of cantilever on an atomic force microscope (magnification 1000x). Credit: SecretDisc GFDL, CC-BY-SA-3.0 Long before the development of AFM, Quate’s research had made waves in microscopy. 1978 ...

A new technical paper titled “Recent Progress in Structural Integrity Evaluation of Microelectronic Packaging Using Scanning Acoustic Microscopy (SAM): A Review” was published by researchers at ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

(a) A scanning electron microscope (SEM) image of the nanoneedle probe used for the measurements. (b) Elasticity map of a 1 µm × 1 µm area on the nuclear surface, showing the change in elasticity ...

For the best results with SAM systems, pay close attention to both the digitizer characteristics and the signal path. Automated inspection techniques are widely used in the semiconductor industry for ...

Researchers have combined two microscopic imaging techniques in one microscope, providing scientists with a high-resolution method of tracking single molecules in a cellular context. The development ...

Researchers at the Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, report in ACS Applied Nano Materials a new method to precisely measure nuclear elasticity—the stiffness or softness ...