The ability to perform optical inspection is a fairly recent addition to the feature set of flying probers, and newer camera technology is helping to boost that ability even further. Seica’s GM David ...
atg Luther & Maelzer, an Xcerra company, has announced the release and the first installations of the new A7-20 PCB flying-probe test system. Specifically designed for the demands of large format, ...
Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
SAN JOSE, Calif.--(BUSINESS WIRE)--July 15, 2004--Electroglas, Inc. (Nasdaq:EGLS), a leading supplier of wafer probing and test handling solutions for the semiconductor industry, today announced that ...
Change in life is inevitable. You know this, yet sometimes you just choose not to accept it. You just close your eyes and think the world has also stopped. But even you realize that’s not the case. It ...
As shrinking die size has caused a reduction in the size of bond pads used as contacts during electrical testing, there is less room for error in the electrical ...
TOKYO, Dec. 09, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced an integrated test cell designed to maximize die-level test ...
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