Logistic Regression with Batch SGD Training and Weight Decay Using C# Dr. James McCaffrey from Microsoft Research presents a complete end-to-end program that explains how to perform binary ...

Introduction: We present an ordinal logistic regression model for identification of items with differential item functioning (DIF) and apply this model to a Mini-Mental State Examination (MMSE) ...

The marginal posterior distribution of the regression parameters of interest is obtained by integrating out the correction terms pertaining to the calibration data set.