Dektak Pro improves surface metrology performance for advanced microelectronics, thick film coatings, and life sciences applications. Stylus profilometry enables high-resolution surface topography ...

By way of a diamond-tipped stylus, samples are analyzed under it on a moving stage according to parameters set by the user (scan length and time). As the stylus traverses the pre-determined length of ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Dektak XTL stylus profiler available ...

Stylus (standard) Diamond, 2.5 micron radius Stylus Tracking Force Programmable, 1 mg to 40 mg (0.1-0.4 milliNewton) Maximum Sample Thickness 45mm (1.5 inches) Sample Stage Diameter 165mm (6.5 inches) ...