It should also be noted that the absolute bias versus nominal value never exceeds 2 nm, confirming the measurement’s nanometer-level accuracy. Figure 6. Plot showing linear answer of LVDT sensor over ...

The data recorded can then be analyzed (up to 30 functions per scan) depending on user interests. These parameter capabilities include: roughness, waviness, step height and geometry (area, radius, ...

This application note describes the advantages of 3D measurement options available through a combination of Bruker's Dektak Stylus Profiler and Vision analysis software. In recent years, the ability ...

Bruker has announced the release of the Dektak XTL Stylus Profiler, extending its industry-leading stylus profilometry capabilities to 200 and 300 millimeter semiconductor wafer fabs and ...

Profilometer (Stylus) - Veeco Dektak®150 . Metrology . Stylus profilers are used to measure surface metrology variations on flat substrates. This profilometer features an automated stage with step ...