Dektak Pro improves surface metrology performance for advanced ... Wafer Vacuum Chucks Interchangeable 2–3", 4–6", and 8" chucks are available. Chucks have vacuum (on/off manual switch) and include ...
The Dektak3ST is a surface profiling system capable of measuring surface textures and variations in the submicro-inch range to a sample thickness of 131 microns. By way of a diamond-tipped stylus, ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Dektak XTL stylus profiler available ...
100 Ǻ to 1,310KǺ (0.4 microinch to 2.5 mils) Vertical Resolution 1Ǻ/65KǺ, 10Ǻ,/655KǺ, 20Ǻ/1,310KǺ Scan Length Range 50 microns to 50 mm (2 mils to 2.5 inches) Scan Speed Ranges Low, Medium, High Scan ...
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