100 Ǻ to 1,310KǺ (0.4 microinch to 2.5 mils) Vertical Resolution 1Ǻ/65KǺ, 10Ǻ,/655KǺ, 20Ǻ/1,310KǺ Scan Length Range 50 microns to 50 mm (2 mils to 2.5 inches) Scan Speed Ranges Low, Medium, High Scan ...
Dektak Pro improves surface metrology performance for advanced ... Wafer Vacuum Chucks Interchangeable 2–3", 4–6", and 8" chucks are available. Chucks have vacuum (on/off manual switch) and include ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Dektak XTL stylus profiler available ...
The Dektak3ST is a surface profiling system capable of measuring surface textures and variations in the submicro-inch range to a sample thickness of 131 microns. By way of a diamond-tipped stylus, ...
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