Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Chinese researchers are working to develop molecular hard drives with high capacity The drives use organometallic molecules ...

Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a ...

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Using the functional probes, the advanced modes—electrostatic force microscopy (EFM_, magnetic FM (MFM), and conductive AFM (C-AFM)—are also accessible. Kelvin probe FM (KPFM) and Scanning Thermal ...

Chinese researchers are exploring the potential of organic materials to develop a new type of hard drive that could ...

(Image: Wikimedia Commons, CC BY-SA 4.0) KPFM is based on the principle of detecting the contact potential difference (CPD) between a conductive AFM tip and the sample surface. This difference is ...

AFM analysis of hydrated samples/liquid medium The atomic force microscope's ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and ...

Numerous SPM modes are available, including AFM, conductive and electrical modes (cAFM, KPFM), STM, liquid cell and electrochemical environment, and chemical mapping via TERS/TEPL. Full control of the ...