Incorporating the latest evolution of Bruker’s industry-leading tip-scanning AFM technology, the Dimension Icon AFM’s temperature-compensating position sensors render noise levels in the sub-angstroms ...
Bruker’s Dimension Icon AFM (atomic force microscope) offers excellent resolution, reliability and productivity, whilst maintaining the highest level of expandability. With the advent of integrated ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Bruker's Dimension Icon AFM integrates the ...
by incorporating Bruker's PeakForce Tapping ® technology. It leverages the many innovations of the Dimension® Icon® System, and is designed to deliver the low drift and low noise necessary to achieve ...
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