Bruker’s Dimension Icon AFM (atomic force microscope) offers excellent resolution, reliability and productivity, whilst maintaining the highest level of expandability. With the advent of integrated ...
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KONTICH, Belgium, February 27, 2025--(BUSINESS WIRE)--Bruker Corporation (Nasdaq: BRKR) today announces the launch of the new X4 POSEIDONâ„¢, a high-performance 3D X-ray microscope (XRM ...
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by incorporating Bruker's PeakForce Tapping ® technology. It leverages the many innovations of the Dimension® Icon® System, and is designed to deliver the low drift and low noise necessary to achieve ...