Bruker currently has a market capitalization of $9.98 billion. In the fourth quarter of 2024, it had an earnings yield of 7.1% compared with the industry’s 5.6%. The company has a trailing four ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...

Image Credit: Bruker JPK Instruments AG Thanks to the capabilities ... The NanoRacer is the fastest commercial, high-speed AFM available, enabling their direct observation in real-time.

Since the AFM-IR technique was first developed, Bruker and its collaborators have developed several AFM-IR modes, including Resonance-Enhanced mode, Tapping AFM-IR mode, Surface Sensitive mode ...

IR, a novel method combining AFM-IR and force volume imaging for precise nanoscale chemical and mechanical analysis.

Bruker’s Dimension Icon AFM (atomic force microscope) offers excellent resolution, reliability and productivity, whilst maintaining the highest level of expandability. With the advent of integrated ...

Image Credit: Bruker Nano Surfaces and Metrology Nexus offers significant benefits for researchers in early-stage labs or those planning to expand their AFM research capabilities: The base ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Most AFMs utilize a compliant cantilever ...

One of the most important acronyms in nanotechnology is AFM – Atomic Force Microscopy. This instrument has become the most widely used tool for imaging, measuring and manipulating matter at the ...

Bruker Corp. engages in the business of ... The BSI Nano segment offers advanced x-ray instruments, atomic force microscopy instrumentation, advanced fluorescence optical microscopy instruments ...

KONTICH, Belgium, February 27, 2025--(BUSINESS WIRE)--Bruker Corporation (Nasdaq: BRKR) today announces the launch of the new X4 POSEIDON™, a high-performance 3D X-ray microscope (XRM ...

The Dimension XR NanoEC SPM utilises Bruker's PeakForce Tapping technology and features the AFM-based PeakForce Scanning Electrochemical Microscopy (PF-SECM). PF-SECM performs the simultaneous ...