An intelligent AFM processing framework integrates optimized scanning trajectories, distortion correction, and deep learning segmentation to ...
Microscopists often wish – and intuit – that the microstructures that they measure correlate somehow to bulk properties. However, this correlation can be hard to measure. Machine learning, in ...
(Nanowerk News) Take a photo with your phone and you might see wonderful details—leaves on a tree, strands of hair blowing in the wind. The width of that strand of hair is 100,000 nanometers wide. The ...
This article discusses a recent study in pre-print in the journal arXiv about a modified method of using atomic force microscopy (AFM) images for a cost-effective structure prediction of ionic ...