Imagine a microscopic locomotive moving back and forth along a track, propelling itself without any external force. At the ...

One of the most important acronyms in nanotechnology is AFM – Atomic Force Microscopy. This instrument has become the most widely used tool for imaging, measuring and manipulating matter at the ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

It is also used in measurements of surface and adhesion forces. The Veeco Dimension 3000 atomic force microscope (AFM) is used to analyze a variety of sample sizes and types. It can function in air or ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...