One of the most important acronyms in nanotechnology is AFM – Atomic Force Microscopy. This instrument has become the most widely used tool for imaging, measuring and manipulating matter at the ...

A larger deflection indicates a higher force experienced by the probe. The majority of AFM instruments use optical methods to assess cantilever deflection with high resolution. Optical methods use ...

A full AFM system, with an unmatched small footprint ... In addition to performing very well in air for surface topographic characterization, the instrument also performs under liquid environments and ...

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension 3000 operates in both tapping and contact modes, with capabilities of topographic and phase imaging, lateral force ...

The researchers predict that the technique could be widely adopted because it requires no modification of a standard AFM instrument.

These improvements range from specialized AFM instruments to the probes and sensors used to characterize samples. The company's range of microscopes includes laser scanning confocal microscopes that ...

In these short segments, I would like to share some cool scans from the AFM, optical microscopes or other instruments I have ...

The exclusive option for plug-and-play cantilever exchange ensures quick and safe operation of the system Samples can be easily accessed from the sides for unique stages and sample holders A built-in ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

To ensure a stable operation, they used a low temperature (5 K), noncontact AFM instrument in constant height mode, with a high stiffness cantilever. They also needed to know the exact atomic ...

The special option for plug-and-play cantilever exchange ensures rapid and safe operation of the system Samples can be freely accessed from the sides for unique stages and sample holders The AFM ...