Bruker Corporation BRKR recently launched the Dimension Nexus atomic force microscope (AFM) at the 2024 MRS Fall Meeting & Exhibit. Dimension Nexus comes with the latest-generation NanoScope 6 ...

Incorporating the latest evolution of Bruker’s industry-leading tip-scanning AFM technology, the Dimension Icon AFM’s temperature-compensating position sensors render noise levels in the sub-angstroms ...

The NanoScope 6 controller further enhances ... NEW Dimension Nexus - best-in-class general purpose AFM. Image Credit: Bruker Nano Surfaces and Metrology Dimension Icon - gold standard for ...

With the latest‑generation NanoScope ® 6 controller, this new small‑footprint AFM delivers wider access to Bruker’s exclusive PeakForce Tapping ® technology and over 50 AFM modes.

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...

Features of the Dimension Edge AFM from Bruker are outlined below. Best Value Closed-Loop Dimension AFM Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels Reduced ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Bruker's Dimension Icon AFM integrates the ...